Browsing Conference contributions by imec author "1ca26774ad2c15fe027456484dd4c3e6bda46bdf"
Now showing items 1-3 of 3
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Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations
Vandemaele, Michiel; Kaczer, Ben; Bury, Erik; Franco, Jacopo; Vaisman Chasin, Adrian; Makarov, Alexander; Mertens, Hans; Hellings, Geert; Groeseneken, Guido (2023-05-15) -
On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors
Tyaginov, Stanislav; Afzalian, Aryan; Makarov, Alexander; Grill, Alexander; Vandemaele, Michiel; Cherenev, Maksim; Vexler, Mikhail; Hellings, Geert; Kaczer, Ben (2022) -
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
Vandemaele, Michiel; Kaczer, Ben; Tyaginov, Stanislav; Bury, Erik; Vaisman Chasin, Adrian; Franco, Jacopo; Makarov, Alexander; Mertens, Hans; Hellings, Geert; Groeseneken, Guido (2022-05-02)