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dc.contributor.authorNawghane, Chinmay
dc.contributor.authorVandevelde, Bart
dc.contributor.authorLabie, Riet
dc.contributor.authorMichiels, Sam
dc.contributor.authorHughes, Danny
dc.contributor.authorLiu, Mengyao
dc.date.accessioned2022-08-30T09:06:28Z
dc.date.available2022-07-04T02:26:26Z
dc.date.available2022-07-20T08:17:13Z
dc.date.available2022-08-09T12:50:47Z
dc.date.available2022-08-30T09:06:28Z
dc.date.issued2022-04-20
dc.identifier.issn2473-2001
dc.identifier.otherWOS:000812322900002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40049.8
dc.sourceWOS
dc.titleA PoF based methodology to assess the reliability of a sensor module operating in harsh industrial environments
dc.typeProceedings paper
dc.contributor.imecauthorNawghane, Chinmay
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorLabie, Riet
dc.contributor.orcidimecNawghane, Chinmay::0000-0002-1867-827X
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecLabie, Riet::0000-0002-1401-1291
dc.identifier.doi10.1109/EuroSimE54907.2022.9758839
dc.identifier.eisbn978-1-6654-5836-8
dc.source.numberofpages6
dc.source.peerreviewyes
dc.subject.disciplineElectrical & electronic engineering
dc.source.conference23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
dc.source.conferencedateAPR 25-27, 2022
dc.source.conferencelocationSt Julian, Malta
dc.source.journalna
imec.availabilityPublished - imec


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