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Polarity-dependent threshold voltage shift in ovonic threshold switches: Challenges and opportunities

dc.contributor.authorRavsher, Taras
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGarbin, Daniele
dc.contributor.authorFantini, Andrea
dc.contributor.authorClima, Sergiu
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorKundu, Shreya
dc.contributor.authorHody, Hubert
dc.contributor.authorDevulder, Wouter
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorAfanas'ev, Valeri
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2022-09-15T09:55:51Z
dc.date.available2022-07-09T02:27:45Z
dc.date.available2022-09-09T11:56:07Z
dc.date.available2022-09-15T09:55:51Z
dc.date.issued2021-12
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000812325400150
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40092.3
dc.sourceWOS
dc.titlePolarity-dependent threshold voltage shift in ovonic threshold switches: Challenges and opportunities
dc.typeProceedings paper
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorHody, Hubert
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecKundu, Shreya::0000-0001-8052-7774
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.identifier.doi10.1109/IEDM19574.2021.9720649
dc.identifier.eisbn978-1-6654-2572-8
dc.source.numberofpages4
dc.source.peerreviewyes
dc.subject.disciplineElectrical & electronic engineering
dc.source.beginpage28.4.1
dc.source.endpage28.4.4
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 11-16, 2021
dc.source.conferencelocationSan Francisco
dc.source.journalna
imec.availabilityPublished - open access


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320.500.12860/40092.3*2022-09-15T09:52:07Zvalidation by library/open access desk
220.500.12860/40092.22022-07-11T07:51:52Zvalidation by imec author
120.500.12860/400922022-07-09T02:27:45Z

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