Extended Scale Length Theory Targeting Low-Dimensional FETs for Carbon Nanotube FET Digital Logic Design-Technology Co-optimization

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dc.contributor.author	Gilardi, C.
dc.contributor.author	Chehab, B.
dc.contributor.author	Sisto, G.
dc.contributor.author	Schuddinck, P.
dc.contributor.author	Ahmed, Z.
dc.contributor.author	Zografos, O.
dc.contributor.author	Lin, Q.
dc.contributor.author	Hellings, G.
dc.contributor.author	Ryckaert, J.
dc.contributor.author	Wong, H-S P.
dc.contributor.author	Mitra, S.
dc.date.accessioned	2022-07-09T02:28:02Z
dc.date.available	2022-07-09T02:28:02Z
dc.date.issued	2021
dc.identifier.issn	2380-9248
dc.identifier.other	WOS:000812325400173
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/40094
dc.source	WOS
dc.title	Extended Scale Length Theory Targeting Low-Dimensional FETs for Carbon Nanotube FET Digital Logic Design-Technology Co-optimization
dc.type	Proceedings paper
dc.contributor.imecauthor	Chehab, B.
dc.contributor.imecauthor	Sisto, G.
dc.contributor.imecauthor	Schuddinck, P.
dc.contributor.imecauthor	Ahmed, Z.
dc.contributor.imecauthor	Zografos, O.
dc.contributor.imecauthor	Hellings, G.
dc.contributor.imecauthor	Ryckaert, J.
dc.identifier.doi	10.1109/IEDM19574.2021.9720672
dc.identifier.eisbn	978-1-6654-2572-8
dc.source.numberofpages	4
dc.source.peerreview	yes
dc.source.conference	IEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedate	DEC 11-16, 2021
dc.source.conferencelocation	San Francisco
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/40094.2	2022-08-25T15:28:21Z	validation by library/open access desk
1	20.500.12860/40094*	2022-07-09T02:28:02Z