dc.contributor.author | Michl, J. | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Stampfer, B. | |
dc.contributor.author | Waldhoer, D. | |
dc.contributor.author | Schleich, C. | |
dc.contributor.author | Knobloch, T. | |
dc.contributor.author | Ioannidis, E. | |
dc.contributor.author | Enichlmair, H. | |
dc.contributor.author | Minixhofer, R. | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Radu, Iuliana | |
dc.contributor.author | Grasser, T. | |
dc.contributor.author | Waltl, M. | |
dc.date.accessioned | 2022-08-25T14:28:55Z | |
dc.date.available | 2022-07-09T02:28:03Z | |
dc.date.available | 2022-08-25T14:28:55Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000812325400007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40100.2 | |
dc.source | WOS | |
dc.title | Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.identifier.doi | 10.1109/IEDM19574.2021.9720501 | |
dc.identifier.eisbn | 978-1-6654-2572-8 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 11-16, 2021 | |
dc.source.conferencelocation | San Francisco | |
dc.source.journal | na | |
imec.availability | Published - imec | |