Publication:

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Date

2021

Proceedings Paper

https://doi.org/10.1109/IEDM19574.2021.9720501

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Author(s)

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Grill, Alexander

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Parvais, Bertrand

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Govoreanu, Bogdan

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Journal

na

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Acq. date: 2026-04-05