Publication:

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Date

2021
Proceedings Paper
https://doi.org/10.1109/IEDM19574.2021.9720501
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dc.contributor.authorMichl, J.
dc.contributor.authorGrill, Alexander
dc.contributor.authorStampfer, B.
dc.contributor.authorWaldhoer, D.
dc.contributor.authorSchleich, C.
dc.contributor.authorKnobloch, T.
dc.contributor.authorIoannidis, E.
dc.contributor.authorEnichlmair, H.
dc.contributor.authorMinixhofer, R.
dc.contributor.authorKaczer, Ben
dc.contributor.authorParvais, Bertrand
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorRadu, Iuliana
dc.contributor.authorGrasser, T.
dc.contributor.authorWaltl, M.
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.accessioned2022-08-25T14:28:55Z
dc.date.available2022-07-09T02:28:03Z
dc.date.available2022-08-25T14:28:55Z
dc.date.issued2021
dc.identifier.doi10.1109/IEDM19574.2021.9720501
dc.identifier.eisbn978-1-6654-2572-8
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40100
dc.publisherIEEE
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 11-16, 2021
dc.source.conferencelocationSan Francisco
dc.source.journalna
dc.source.numberofpages4
dc.subject.keywordsTEMPERATURE
dc.subject.keywordsDEFECTS
dc.title

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

dc.typeProceedings paper
dspace.entity.typePublication
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