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Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
Publication:
Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
Date
2021
Proceedings Paper
https://doi.org/10.1109/IEDM19574.2021.9720501
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Michl, J.
;
Grill, Alexander
;
Stampfer, B.
;
Waldhoer, D.
;
Schleich, C.
;
Knobloch, T.
;
Ioannidis, E.
;
Enichlmair, H.
;
Minixhofer, R.
;
Kaczer, Ben
;
Parvais, Bertrand
;
Govoreanu, Bogdan
;
Radu, Iuliana
;
Grasser, T.
;
Waltl, M.
Journal
na
Abstract
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1645
since deposited on 2022-07-09
Acq. date: 2025-10-23
Citations
Metrics
Views
1645
since deposited on 2022-07-09
Acq. date: 2025-10-23
Citations