Publication:

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Date

2021
Proceedings Paper
https://doi.org/10.1109/IEDM19574.2021.9720501
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Author(s)

Michl, J.
;
Grill, Alexander  
;
Stampfer, B.
;
Waldhoer, D.
;
Schleich, C.
;
Knobloch, T.
;
Ioannidis, E.
;
Enichlmair, H.
;
Minixhofer, R.
;
Kaczer, Ben  
;
Parvais, Bertrand  
;
Govoreanu, Bogdan  
;
Radu, Iuliana  
;
Grasser, T.
;
Waltl, M.

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na

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1651 since deposited on 2022-07-09
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