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dc.contributor.authorLin, Ji-Yung
dc.contributor.authorWeckx, Pieter
dc.contributor.authorMishra, Subrat
dc.contributor.authorSpessot, Alessio
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2022-09-01T11:08:26Z
dc.date.available2022-07-17T02:27:35Z
dc.date.available2022-09-01T11:08:26Z
dc.date.issued2022
dc.identifier.issn1530-1591
dc.identifier.otherWOS:000819484300119
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40126.2
dc.sourceWOS
dc.titleProactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology
dc.typeProceedings paper
dc.contributor.imecauthorLin, Ji-Yung
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorMishra, Subrat
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecLin, Ji-Yung::0000-0001-9119-6069
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.identifier.doi10.23919/DATE54114.2022.9774659
dc.identifier.eisbn978-3-9819263-6-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage616
dc.source.endpage619
dc.source.conference25th Design, Automation and Test in Europe Conference and Exhibition (DATE)
dc.source.conferencedateMAR 14-23, 2022
dc.source.conferencelocationAntwerpen
dc.source.journalna
imec.availabilityPublished - imec


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