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Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2022-07-18T02:27:52Z | |
dc.date.available | 2022-07-18T02:27:52Z | |
dc.date.issued | 2021 | |
dc.identifier.other | WOS:000805289900322 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40136 | |
dc.source | WOS | |
dc.title | Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.identifier.doi | 10.23919/DATE51398.2021.9473999 | |
dc.identifier.eisbn | 978-3-9819263-5-4 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1717 | |
dc.source.endpage | 1722 | |
dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
dc.source.conferencedate | FEB 01-05, 2021 | |
imec.availability | Under review |
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