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Scaling study of contact operation at constant current in self-aligned top-gated oxide semiconductor field-effect transistors
dc.contributor.author | Chien, Yu-Chieh | |
dc.contributor.author | Nag, Manoj | |
dc.contributor.author | Genoe, Jan | |
dc.contributor.author | Rolin, Cedric | |
dc.date.accessioned | 2022-07-28T02:30:39Z | |
dc.date.available | 2022-07-28T02:30:39Z | |
dc.date.issued | 2022-SEP | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:000827395800002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40178 | |
dc.source | WOS | |
dc.title | Scaling study of contact operation at constant current in self-aligned top-gated oxide semiconductor field-effect transistors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Chien, Yu-Chieh | |
dc.contributor.imecauthor | Nag, Manoj | |
dc.contributor.imecauthor | Genoe, Jan | |
dc.contributor.imecauthor | Rolin, Cedric | |
dc.contributor.orcidimec | Genoe, Jan::0000-0002-4019-5979 | |
dc.contributor.orcidimec | Rolin, Cedric::0000-0001-5542-8504 | |
dc.identifier.doi | 10.1016/j.sse.2022.108406 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.volume | 195 | |
imec.availability | Under review |
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