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Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Simons, Veerle | |
dc.contributor.author | Truijen, Brecht | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Van Sever, Koen | |
dc.contributor.author | Tsiara, Artemisia | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Absil, Philippe | |
dc.date.accessioned | 2022-08-05T02:35:40Z | |
dc.date.available | 2022-08-05T02:35:40Z | |
dc.date.issued | 2022 | |
dc.identifier.other | WOS:000828152500413 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40205 | |
dc.source | WOS | |
dc.title | Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Simons, Veerle | |
dc.contributor.imecauthor | Truijen, Brecht | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Van Sever, Koen | |
dc.contributor.imecauthor | Tsiara, Artemisia | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Absil, Philippe | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Simons, Veerle::0000-0001-5714-955X | |
dc.contributor.orcidimec | Truijen, Brecht::0000-0002-2288-1414 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Tsiara, Artemisia::0000-0002-5612-6468 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.identifier.eisbn | 978-1-55752-466-9 | |
dc.source.numberofpages | 3 | |
dc.source.peerreview | yes | |
dc.source.conference | Optical Fiber Communications Conference and Exhibition (OFC) | |
dc.source.conferencedate | MAR 06-10, 2022 | |
dc.source.conferencelocation | San Diego | |
imec.availability | Under review |
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