dc.contributor.author | Tadatomo, Hiroki | |
dc.contributor.author | Dauendorffer, Arnaud | |
dc.contributor.author | Onitsuka, Tomoya | |
dc.contributor.author | Genjima, Hisashi | |
dc.contributor.author | Ido, Yasuyuki | |
dc.contributor.author | Okada, Soichiro | |
dc.contributor.author | Kuwahara, Yuhei | |
dc.contributor.author | Hara, Arisa | |
dc.contributor.author | Dinh, Congque | |
dc.contributor.author | Fujimoto, Seiji | |
dc.contributor.author | Kawakami, Shinichiro | |
dc.contributor.author | Muramatsu, Makoto | |
dc.contributor.author | Shimura, Satoru | |
dc.contributor.author | Nafus, Kathleen | |
dc.contributor.author | Oikawa, Noriaki | |
dc.contributor.author | Ono, Kenta | |
dc.contributor.author | Feurprier, Yannick | |
dc.contributor.author | Demand, Marc | |
dc.contributor.author | Negreira, Ainhoa Romo | |
dc.contributor.author | Nagahara, Seiji | |
dc.contributor.author | Blanco, Victor | |
dc.contributor.author | Foubert, Philippe | |
dc.contributor.author | De Simone, Danilo | |
dc.date.accessioned | 2023-01-04T10:50:41Z | |
dc.date.available | 2022-09-08T02:39:18Z | |
dc.date.available | 2023-01-04T10:50:41Z | |
dc.date.issued | 2022 | |
dc.identifier.isbn | 978-1-5106-4987-3 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:000844514700014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40392.2 | |
dc.source | WOS | |
dc.title | Approaches to Enable Patterning of Tight Pitches towards High NA EUV | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Blanco, Victor | |
dc.contributor.imecauthor | Foubert, Philippe | |
dc.contributor.imecauthor | De Simone, Danilo | |
dc.contributor.orcidimec | De Simone, Danilo::0000-0003-3927-5207 | |
dc.contributor.orcidimec | Blanco, Victor::0000-0003-4308-0381 | |
dc.identifier.doi | 10.1117/12.2614012 | |
dc.identifier.eisbn | 978-1-5106-4988-0 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 120560F | |
dc.source.conference | Conference on Advanced Etch Technology and Process Integration for Nanopatterning XI Part of SPIE Advanced Lithography and Patterning Conference | |
dc.source.conferencedate | APR 24-MAY 27, 2020-2022 | |
dc.source.conferencelocation | San Jose | |
dc.source.journal | Proceedings of SPIE | |
dc.source.volume | 12056 | |
imec.availability | Published - imec | |