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Special Session: STT-MRAMs: Technology, Design and Test
dc.contributor.author | Gebregiorgis, Anteneh | |
dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Muench, Christopher | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Tahoori, Mehdi B. | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2022-10-11T13:20:50Z | |
dc.date.available | 2022-09-16T02:49:57Z | |
dc.date.available | 2022-10-11T13:20:50Z | |
dc.date.issued | 2022-06-15 | |
dc.identifier.issn | 1093-0167 | |
dc.identifier.other | WOS:000850232500049 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40434.2 | |
dc.source | WOS | |
dc.title | Special Session: STT-MRAMs: Technology, Design and Test | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.identifier.doi | 10.1109/VTS52500.2021.9794278 | |
dc.identifier.eisbn | 978-1-6654-1060-1 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Applied physics | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.conference | 40th IEEE VLSI Test Symposium (VTS) | |
dc.source.conferencedate | APR 25-27, 2022 | |
dc.source.conferencelocation | San Diego, CA, USA | |
dc.source.journal | 2022 IEEE 40th VLSI Test Symposium (VTS) | |
imec.availability | Under review |