EISBN
978-1-6654-1060-1
ISSN
1093-0167
Conference
40th IEEE VLSI Test Symposium (VTS)
Journal
2022 IEEE 40th VLSI Test Symposium (VTS)
Research discipline
Applied physics; Electrical & electronic engineering
Title
Special Session: STT-MRAMs: Technology, Design and Test
Publication type
Proceedings paper
Embargo date
9999-12-31