Browsing by author "Wu, Lizhou"
Now showing items 1-11 of 11
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Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2022) -
Defect and Fault Modeling Framework for STT-MRAM Testing
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Medeiros, Guilherme Cardoso; Fieback, Moritz; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Device-aware test: A new test approach towards DPPB
Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11) -
Electrical modeling of STT-MRAM defects
Wu, Lizhou; Taouil, Mottaqiallah; Rao, Siddharth; Marinissen, Erik Jan; Hamdioui, Said (2018-11) -
Impact of Magnetic Coupling and Density on STT-MRAM Performance
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2022-01-04) -
Pinhole defect characterization and modeling for STT-MRAM testing
Wu, Lizhou; Rao, Siddharth; Cardoso Medeiros, Guilherme; Taouil, Mottaqiallah; Marinissen, Erik Jan; Yasin, Farrukh; Couet, Sebastien; Hamdioui, Said; Kar, Gouri Sankar (2019-05) -
Special Session: STT-MRAMs: Technology, Design and Test
Gebregiorgis, Anteneh; Wu, Lizhou; Muench, Christopher; Rao, Siddharth; Tahoori, Mehdi B.; Hamdioui, Said (2022-06-15) -
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021)