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Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
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Authors
Wu, Lizhou
;
Rao, Siddharth
;
Taouil, Mottaqiallah
;
Marinissen, Erik Jan
;
Kar, Gouri Sankar
;
Hamdioui, Said
DOI
10.1109/TC.2021.3125228
ISSN
0018-9340
Issue
9
Journal
IEEE TRANSACTIONS ON COMPUTERS
Volume
71
Title
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Publication type
Journal article
Embargo date
9999-12-31
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3
20.500.12860/40291.3
*
2022-08-30T10:29:46Z
validation by library/open access desk
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20.500.12860/40291.2
2022-08-29T08:45:10Z
validation by imec author
1
20.500.12860/40291
2022-08-23T02:32:57Z
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