Browsing by author "Taouil, Mottaqiallah"
Now showing items 1-20 of 43
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3D-COSTAR for 2.5D and 3D stacked IC cost optimization
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2014-12) -
3D-COSTAR: A cost model for 3D stacked ICs
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2013) -
3D-COSTAR: A cost model for 3D-SICs
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2012-12) -
3D-COSTAR: A cost model for 3D-SICs
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2012-11) -
3D-COSTAR: A tool for 2.5D/3D test flow optimization
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2015-10) -
A Classification of Memory-Centric Computing
Hoang Anh Du Nguyen; Yu, Jintao; Abu Lebdeh, Muath; Taouil, Mottaqiallah; Hamdioui, Said; Catthoor, Francky (2020) -
A Survey on Memory-centric Computer Architectures
Gebregiorgis, Anteneh; Hoang Anh Du Nguyen; Yu, Jintao; Bishnoi, Rajendra; Taouil, Mottaqiallah; Catthoor, Francky; Hamdioui, Said (2022) -
BTI analysis for high performance and low power SRAM sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2022) -
Comparative analysis of RD and atomistic trap-based BTI models on SRAM sense amplifier
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Cosemans, Stefan; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Comparative BTI analysis for various sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky (2016) -
Comparative BTI impact for SRAM cell and sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2015) -
Cost modeling for 2.5D and 3D stacked ICs
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2019-03) -
Defect and Fault Modeling Framework for STT-MRAM Testing
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Medeiros, Guilherme Cardoso; Fieback, Moritz; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Device Aware Diagnosis for Unique Defects in STT-MRAMs
Aouichi, Ahmed; Yuan, Sicong; Fieback, Moritz; Rao, Siddharth; Kim, Woojin; Marinissen, Erik Jan; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2023) -
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Yuan, Sicong; Taouil, Mottaqiallah; Fieback, Moritz; Xun, Hanzhi; Marinissen, Erik Jan; Kar, Gouri Sankar; Rao, Siddharth; Couet, Sebastien; Hamdioui, Said (2023) -
Device-aware test: A new test approach towards DPPB
Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10)