Publication:

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

Date

2022
Journal article
https://doi.org/10.1109/TC.2021.3125228
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Author(s)

Wu, Lizhou
;
Rao, Siddharth  
;
Taouil, Mottaqiallah
;
Marinissen, Erik Jan  
;
Kar, Gouri Sankar  
;
Hamdioui, Said

Journal

IEEE TRANSACTIONS ON COMPUTERS

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