Publication:

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

Date

2022
Journal article
https://doi.org/10.1109/TC.2021.3125228
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dc.contributor.authorWu, Lizhou
dc.contributor.authorRao, Siddharth
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorHamdioui, Said
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2023-02-02T13:59:40Z
dc.date.available2022-08-23T02:32:57Z
dc.date.available2022-08-29T08:48:23Z
dc.date.available2023-02-02T13:59:40Z
dc.date.embargo9999-12-31
dc.date.issued2022
dc.identifier.doi10.1109/TC.2021.3125228
dc.identifier.issn0018-9340
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40291
dc.publisherIEEE COMPUTER SOC
dc.source.beginpage2219
dc.source.endpage2233
dc.source.issue9
dc.source.journalIEEE TRANSACTIONS ON COMPUTERS
dc.source.numberofpages15
dc.source.volume71
dc.title

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

dc.typeJournal article
dspace.entity.typePublication
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