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Feasibility analysis of embedded MRAM solutions at advanced process nodes

dc.contributor.authorPerumkunnil, Manu
dc.contributor.authorGupta, Mohit
dc.contributor.authorRao, Siddharth
dc.contributor.authorKim, Woojin
dc.contributor.authorYasin, Farrukh
dc.contributor.authorCouet, Sebastien
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2023-06-20T11:28:39Z
dc.date.available2022-09-22T02:50:26Z
dc.date.available2023-06-20T11:28:39Z
dc.date.issued2022
dc.identifier.issnna
dc.identifier.otherWOS:000852566800022
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40471.3
dc.sourceWOS
dc.titleFeasibility analysis of embedded MRAM solutions at advanced process nodes
dc.typeProceedings paper
dc.contributor.imecauthorPerumkunnil, Manu
dc.contributor.imecauthorGupta, Mohit
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecGupta, Mohit::0000-0002-1924-1264
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecKim, Woojin::0000-0002-2755-6661
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecPerumkunnil, Manu::0000-0002-0029-6548
dc.identifier.doi10.1109/EDTM53872.2022.9798029
dc.identifier.eisbn978-1-6654-2178-2
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.beginpage73
dc.source.endpage75
dc.source.conference6th IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
dc.source.conferencedateMAR 06-09, 2022
dc.source.conferencelocationOita, Japan
dc.source.journalna
imec.availabilityPublished - imec


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320.500.12860/40471.3*2023-06-20T11:24:07Zvalidation by library/open access desk
120.500.12860/404712022-09-22T02:50:26Z

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