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Breakdown and recovery of thin gate oxides

dc.contributor.authorBearda, Twan
dc.contributor.authorMertens, Paul
dc.contributor.authorHeyns, Marc
dc.contributor.authorWoerlee, P.
dc.contributor.authorWallinga, H.
dc.date.accessioned2021-10-14T12:40:25Z
dc.date.available2021-10-14T12:40:25Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4100
dc.sourceIIOimport
dc.titleBreakdown and recovery of thin gate oxides
dc.typeProceedings paper
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage116
dc.source.endpage119
dc.source.conferenceProceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2000
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - open access


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