dc.contributor.author | Vais, Abhitosh | |
dc.contributor.author | Yadav, Sachin | |
dc.contributor.author | Mols, Yves | |
dc.contributor.author | Vermeersch, Bjorn | |
dc.contributor.author | Vondkar Kodandarama, Komal | |
dc.contributor.author | Baryshnikova, Marina | |
dc.contributor.author | Mannaert, Geert | |
dc.contributor.author | Alcotte, Reynald | |
dc.contributor.author | Boccardi, Guillaume | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Langer, Robert | |
dc.contributor.author | Kunert, Bernardette | |
dc.contributor.author | Collaert, Nadine | |
dc.date.accessioned | 2023-06-01T14:09:29Z | |
dc.date.available | 2023-02-09T03:20:55Z | |
dc.date.available | 2023-06-01T14:09:29Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1930-8876 | |
dc.identifier.other | WOS:000904209900012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41069.2 | |
dc.source | WOS | |
dc.title | III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vais, Abhitosh | |
dc.contributor.imecauthor | Yadav, Sachin | |
dc.contributor.imecauthor | Mols, Yves | |
dc.contributor.imecauthor | Vermeersch, Bjorn | |
dc.contributor.imecauthor | Vondkar Kodandarama, Komal | |
dc.contributor.imecauthor | Baryshnikova, Marina | |
dc.contributor.imecauthor | Mannaert, Geert | |
dc.contributor.imecauthor | Alcotte, Reynald | |
dc.contributor.imecauthor | Boccardi, Guillaume | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Langer, Robert | |
dc.contributor.imecauthor | Kunert, Bernardette | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.orcidimec | Vais, Abhitosh::0000-0002-0317-7720 | |
dc.contributor.orcidimec | Yadav, Sachin::0000-0003-4530-2603 | |
dc.contributor.orcidimec | Mols, Yves::0000-0002-7072-0113 | |
dc.contributor.orcidimec | Vermeersch, Bjorn::0000-0001-8640-672X | |
dc.contributor.orcidimec | Baryshnikova, Marina::0000-0002-5945-4459 | |
dc.contributor.orcidimec | Boccardi, Guillaume::0000-0003-3226-4572 | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Langer, Robert::0000-0002-1132-3468 | |
dc.contributor.orcidimec | Kunert, Bernardette::0000-0002-8986-4109 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Mannaert, Geert::0009-0003-1267-5355 | |
dc.contributor.orcidimec | Alcotte, Reynald::0009-0001-6529-0948 | |
dc.identifier.doi | 10.1109/ESSDERC55479.2022.9947124 | |
dc.identifier.eisbn | 978-1-6654-8497-8 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 261 | |
dc.source.endpage | 264 | |
dc.source.conference | 52nd IEEE European Solid-State Device Research Conference (ESSDERC) | |
dc.source.conferencedate | SEP 19-22, 2022 | |
dc.source.conferencelocation | Milan | |
dc.source.journal | na | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The authors gratefully acknowledge the support of imec members from 300mm fab, III-V lab and the amsimec lab. | |