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dc.contributor.authorSantermans, Sybren
dc.contributor.authorHellings, Geert
dc.contributor.authorHeyns, Marc
dc.contributor.authorVan Roy, Wim
dc.contributor.authorMartens, Koen
dc.date.accessioned2023-11-29T11:02:04Z
dc.date.available2023-02-12T03:19:49Z
dc.date.available2023-02-17T14:00:21Z
dc.date.available2023-11-29T11:02:04Z
dc.date.issued2023-01-16
dc.identifier.issn2040-3364
dc.identifier.otherWOS:000917937800001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41091.3
dc.sourceWOS
dc.titleUnraveling the impact of nano-scaling on silicon field-effect transistors for the detection of single-molecules
dc.typeJournal article
dc.contributor.imecauthorSantermans, Sybren
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.orcidimecSantermans, Sybren::0000-0002-0843-102X
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.date.embargo2024-01-31
dc.identifier.doi10.1039/d2nr05267a
dc.source.numberofpages15
dc.source.peerreviewyes
dc.subject.disciplineApplied physics
dc.source.beginpage2354
dc.source.endpage2368
dc.source.journalNANOSCALE
dc.identifier.pmidMEDLINE:36644797
dc.source.issue5
dc.source.volume15
imec.availabilityPublished - imec


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