dc.contributor.author | Santermans, Sybren | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Van Roy, Wim | |
dc.contributor.author | Martens, Koen | |
dc.date.accessioned | 2023-11-29T11:02:04Z | |
dc.date.available | 2023-02-12T03:19:49Z | |
dc.date.available | 2023-02-17T14:00:21Z | |
dc.date.available | 2023-11-29T11:02:04Z | |
dc.date.issued | 2023-01-16 | |
dc.identifier.issn | 2040-3364 | |
dc.identifier.other | WOS:000917937800001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41091.3 | |
dc.source | WOS | |
dc.title | Unraveling the impact of nano-scaling on silicon field-effect transistors for the detection of single-molecules | |
dc.type | Journal article | |
dc.contributor.imecauthor | Santermans, Sybren | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Van Roy, Wim | |
dc.contributor.orcidimec | Santermans, Sybren::0000-0002-0843-102X | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Van Roy, Wim::0000-0003-3232-1987 | |
dc.date.embargo | 2024-01-31 | |
dc.identifier.doi | 10.1039/d2nr05267a | |
dc.source.numberofpages | 15 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Applied physics | |
dc.source.beginpage | 2354 | |
dc.source.endpage | 2368 | |
dc.source.journal | NANOSCALE | |
dc.identifier.pmid | MEDLINE:36644797 | |
dc.source.issue | 5 | |
dc.source.volume | 15 | |
imec.availability | Published - imec | |