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Hall probe microscopy

dc.contributor.authorBekaert, Joost
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorVan Bael, Marleen
dc.contributor.authorTemst, K.
dc.contributor.authorMoshchalkov, V. V.
dc.contributor.authorBruynseraede, Y.
dc.date.accessioned2021-10-14T12:40:39Z
dc.date.available2021-10-14T12:40:39Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4109
dc.sourceIIOimport
dc.titleHall probe microscopy
dc.typeMeeting abstract
dc.contributor.imecauthorBekaert, Joost
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecBekaert, Joost::0000-0003-3075-3479
dc.source.peerreviewno
dc.source.beginpage23
dc.source.conferenceNEVAC / NNV Symposium "Toepassingen van Magnetische Nanostrukturen"
dc.source.conferencedate17/11/2000
dc.source.conferencelocationEindhoven The Netherlands
imec.availabilityPublished - imec


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