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dc.contributor.authorSanctorum, Jonathan
dc.contributor.authorSix, Nathanael
dc.contributor.authorSijbers, Jan
dc.contributor.authorDe Beenhouwer, Jan
dc.date.accessioned2023-02-16T03:20:13Z
dc.date.available2023-02-16T03:20:13Z
dc.date.issued2022
dc.identifier.issn0277-786X
dc.identifier.otherWOS:000905573200032
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41106
dc.sourceWOS
dc.titleAugmenting a conventional X-ray scanner with edge illumination-based phase contrast imaging: how to design the gratings?
dc.typeProceedings paper
dc.contributor.imecauthorSanctorum, Jonathan
dc.contributor.imecauthorSix, Nathanael
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.orcidimecSanctorum, Jonathan::0000-0001-7968-4705
dc.contributor.orcidimecSix, Nathanael::0000-0002-6207-481X
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.identifier.doi10.1117/12.2633455
dc.identifier.eisbn978-1-5106-5469-3
dc.source.numberofpages6
dc.source.peerreviewyes
dc.source.conferenceSPIE's Conference on Developments in X-Ray Tomography XIV
dc.source.conferencedateAUG 22-24, 2022
dc.source.conferencelocationSan Diego
dc.source.volume12242
imec.availabilityUnder review


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