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dc.contributor.authorLuso, Domenico
dc.contributor.authorChatterjee, S.
dc.contributor.authorHeylen, R.
dc.contributor.authorCornelissen, S.
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSijbers, Jan
dc.date.accessioned2023-03-30T12:20:46Z
dc.date.available2023-02-16T03:20:14Z
dc.date.available2023-03-30T12:20:46Z
dc.date.issued2022
dc.identifier.issn0277-786X
dc.identifier.otherWOS:000905573200043
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41109.2
dc.sourceWOS
dc.titleEvaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing
dc.typeProceedings paper
dc.contributor.imecauthorLuso, Domenico
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecLuso, Domenico::0000-0001-7919-7878
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.identifier.doi10.1117/12.2633318
dc.identifier.eisbn978-1-5106-5469-3
dc.source.numberofpages8
dc.source.peerreviewyes
dc.source.beginpage122421K
dc.source.conferenceSPIE's Conference on Developments in X-Ray Tomography XIV
dc.source.conferencedateAUG 22-24, 2022
dc.source.conferencelocationSan Diego
dc.source.journalProceedings of SPIE
dc.source.volume12242
imec.availabilityPublished - imec
dc.description.wosFundingTextThis work is financially supported by the VLAIO ICON project VIL (HBC.2019.2808) and the Research Foundation -Flanders (FWO) (S004217N, S003421N) and the Flemish Government under the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen" programme.


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