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Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing
dc.contributor.author | Iuso, D. | |
dc.contributor.author | Chatterjee, S. | |
dc.contributor.author | Heylen, R. | |
dc.contributor.author | Cornelissen, S. | |
dc.contributor.author | De Beenhouwer, J. | |
dc.contributor.author | Sijbers, J. | |
dc.date.accessioned | 2023-02-16T03:20:14Z | |
dc.date.available | 2023-02-16T03:20:14Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:000905573200043 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41109 | |
dc.source | WOS | |
dc.title | Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Iuso, D. | |
dc.contributor.imecauthor | De Beenhouwer, J. | |
dc.contributor.imecauthor | Sijbers, J. | |
dc.identifier.doi | 10.1117/12.2633318 | |
dc.identifier.eisbn | 978-1-5106-5469-3 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.conference | SPIE's Conference on Developments in X-Ray Tomography XIV | |
dc.source.conferencedate | AUG 22-24, 2022 | |
dc.source.conferencelocation | San Diego | |
dc.source.volume | 12242 | |
imec.availability | Under review |
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