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Analyzing the Electromigration Challenges of Computation in Resistive Memories
dc.contributor.author | Mayahinia, Mahta | |
dc.contributor.author | Tahoori, Mehdi | |
dc.contributor.author | Perumkunnil, Manu | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Catthoor, Francky | |
dc.date.accessioned | 2023-03-10T11:59:28Z | |
dc.date.available | 2023-02-24T03:29:07Z | |
dc.date.available | 2023-03-10T11:59:28Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1089-3539 | |
dc.identifier.other | WOS:000918580100065 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41134.2 | |
dc.source | WOS | |
dc.title | Analyzing the Electromigration Challenges of Computation in Resistive Memories | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Perumkunnil, Manu | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.orcidimec | Perumkunnil, Manu::0000-0002-0029-6548 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.identifier.doi | 10.1109/ITC50671.2022.00067 | |
dc.identifier.eisbn | 978-1-6654-6270-9 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 534 | |
dc.source.endpage | 538 | |
dc.source.conference | IEEE International Test Conference (ITC) | |
dc.source.conferencedate | SEP 25-30, 2022 | |
dc.source.conferencelocation | Anaheim | |
dc.source.journal | Proceedings of IEEE ITC 2022 | |
imec.availability | Under review |