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Degradation mechanisms in Germanium Electro-Absorption Modulators

dc.contributor.authorTsiara, Artemisia
dc.contributor.authorLesniewska, Alicja
dc.contributor.authorRoussel, Philippe
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorBerciano, Mathias
dc.contributor.authorSimicic, Marko
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorCroes, Kristof
dc.date.accessioned2023-04-28T07:35:16Z
dc.date.available2023-02-27T03:27:55Z
dc.date.available2023-04-28T07:35:16Z
dc.date.issued2022
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000922926400046
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41154.2
dc.sourceWOS
dc.titleDegradation mechanisms in Germanium Electro-Absorption Modulators
dc.typeProceedings paper
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorLesniewska, Alicja
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorBerciano, Mathias
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecLesniewska, Alicja::0000-0003-3863-065X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecBerciano, Mathias::0000-0003-0428-7005
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.embargo2022-03-31
dc.identifier.doi10.1109/IRPS48227.2022.9764469
dc.identifier.eisbn978-1-6654-7950-9
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
imec.availabilityPublished - open access
dc.description.wosFundingTextThis work was supported by imec's industrial affiliation R&D program on Optical I/O. Authors would like to thank the participants of imec's Si Photonics Reliability Meeting and the members of the REL group for fruitful and stimulating discussions. In particular Laura Nuttin and Liese Hubrechtsen, MSc students from KU Leuven, for operational work in the BTS results.


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