MTJ degradation in SOT-MRAM by self-heating-induced diffusion

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dc.contributor.author	Van Beek, Simon
dc.contributor.author	Cai, Kaiming
dc.contributor.author	Rao, Siddharth
dc.contributor.author	Jayakumar, Ganesh
dc.contributor.author	Couet, Sebastien
dc.contributor.author	Jossart, Nico
dc.contributor.author	Chasin, Adrian
dc.contributor.author	Kar, Gouri Sankar
dc.date.accessioned	2023-02-27T03:27:55Z
dc.date.available	2023-02-27T03:27:55Z
dc.date.issued	2022
dc.identifier.issn	1541-7026
dc.identifier.other	WOS:000922926400041
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/41155
dc.source	WOS
dc.title	MTJ degradation in SOT-MRAM by self-heating-induced diffusion
dc.type	Proceedings paper
dc.contributor.imecauthor	Van Beek, Simon
dc.contributor.imecauthor	Cai, Kaiming
dc.contributor.imecauthor	Rao, Siddharth
dc.contributor.imecauthor	Jayakumar, Ganesh
dc.contributor.imecauthor	Couet, Sebastien
dc.contributor.imecauthor	Jossart, Nico
dc.contributor.imecauthor	Chasin, Adrian
dc.contributor.imecauthor	Kar, Gouri Sankar
dc.contributor.orcidimec	Van Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimec	Cai, Kaiming::0000-0002-1160-864X
dc.contributor.orcidimec	Rao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimec	Couet, Sebastien::0000-0001-6436-9593
dc.identifier.doi	10.1109/IRPS48227.2022.9764459
dc.identifier.eisbn	978-1-6654-7950-9
dc.source.numberofpages	4
dc.source.peerreview	yes
dc.source.conference	IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate	MAR 27-31, 2022
dc.source.conferencelocation	Dallas
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/41155.2	2023-06-08T09:05:07Z	validation by library/open access desk
1	20.500.12860/41155*	2023-02-27T03:27:55Z