Advanced CMOS Technology Challenges for Robust ESD Design
| dc.contributor.author | Chen, Shih-Hung | |
| dc.date.accessioned | 2023-04-25T10:11:56Z | |
| dc.date.available | 2023-02-27T03:28:05Z | |
| dc.date.available | 2023-04-25T10:11:56Z | |
| dc.date.issued | 2022 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.other | WOS:000922926400183 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41158.2 | |
| dc.source | WOS | |
| dc.title | Advanced CMOS Technology Challenges for Robust ESD Design | |
| dc.type | Meeting abstract | |
| dc.contributor.imecauthor | Chen, Shih-Hung | |
| dc.contributor.orcidimec | Chen, Shih-Hung::0000-0002-6481-2951 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.source.numberofpages | 2 | |
| dc.source.peerreview | no | |
| dc.source.beginpage | TuT10 | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| imec.availability | Published - imec |
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