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Advanced CMOS Technology Challenges for Robust ESD Design

dc.contributor.authorChen, Shih-Hung
dc.date.accessioned2023-02-27T03:28:05Z
dc.date.available2023-02-27T03:28:05Z
dc.date.issued2022
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000922926400183
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41158
dc.sourceWOS
dc.titleAdvanced CMOS Technology Challenges for Robust ESD Design
dc.typeMeeting abstract
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.identifier.eisbn978-1-6654-7950-9
dc.source.numberofpages2
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
imec.availabilityUnder review


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220.500.12860/41158.22023-04-25T10:10:36Zvalidation by library/open access desk
120.500.12860/41158*2023-02-27T03:28:05Z

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