dc.contributor.author | Varela Pedreira, Olalla | |
dc.contributor.author | Lofrano, Melina | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | van der Veen, Marleen | |
dc.contributor.author | Simons, Veerle | |
dc.contributor.author | Chery, Emmanuel | |
dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Croes, Kristof | |
dc.date.accessioned | 2023-04-25T10:27:13Z | |
dc.date.available | 2023-02-27T03:28:06Z | |
dc.date.available | 2023-04-25T10:27:13Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000922926400015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41160.2 | |
dc.source | WOS | |
dc.title | Assessment of critical Co electromigration parameters | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Varela Pedreira, Olalla | |
dc.contributor.imecauthor | Lofrano, Melina | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | van der Veen, Marleen | |
dc.contributor.imecauthor | Simons, Veerle | |
dc.contributor.imecauthor | Chery, Emmanuel | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.orcidimec | Varela Pedreira, Olalla::0000-0002-2987-1972 | |
dc.contributor.orcidimec | Zahedmanesh, Houman::0000-0002-0290-691X | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | van der Veen, Marleen::0000-0002-9402-8922 | |
dc.contributor.orcidimec | Simons, Veerle::0000-0001-5714-955X | |
dc.contributor.orcidimec | Chery, Emmanuel::0000-0002-2526-3873 | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.identifier.doi | 10.1109/IRPS48227.2022.9764427 | |
dc.identifier.eisbn | 978-1-6654-7950-9 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 27-31, 2022 | |
dc.source.conferencelocation | Dallas | |
dc.source.journal | na | |
imec.availability | Published - imec | |