Publication:

Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon

Date

2022
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764597
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Author(s)

Hsieh, Ping-Yi  
;
Tsiara, Artemisia  
;
O'Sullivan, Barry  
;
Yudistira, Didit  
;
Baryshnikova, Marina  
;
Groeseneken, Guido  
;
Kunert, Bernardette  
;
Pantouvaki, Marianna  
;
Van Campenhout, Joris  
;
De Wolf, Ingrid  

Journal

IEEE International Reliability Physics Symposium (IRPS)

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137 since deposited on 2023-02-27
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1318 since deposited on 2023-02-27
Acq. date: 2026-02-25

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