Publication:

Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon

Date

2022
Proceedings Paper
https://doi.org/10.1109/irps48227.2022.9764597
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Author(s)

Hsieh, Ping-Yi
;
Tsiara, Artemisia
;
O'Sullivan, Barry
;
Yudistira, Didit
;
Baryshnikova, Marina
;
Groeseneken, Guido
;
Kunert, Bernardette
;
Pantouvaki, Marianna
;
Van Campenhout, Joris
;
De Wolf, Ingrid

Journal

IEEE International Reliability Physics Symposium (IRPS)

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211 since deposited on 2023-02-27
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