dc.contributor.author | Zhang, Huaichen | |
dc.contributor.author | Tabery, Cyrus | |
dc.contributor.author | Maas, Ruben | |
dc.contributor.author | Khodko, Oleksandr | |
dc.contributor.author | Blanco, Victor | |
dc.contributor.author | Canga, Eren | |
dc.contributor.author | Schleicher, Filip | |
dc.date.accessioned | 2023-03-20T09:28:57Z | |
dc.date.available | 2023-03-01T03:27:56Z | |
dc.date.available | 2023-03-20T09:28:57Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1932-5150 | |
dc.identifier.other | WOS:000924949300019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41210.2 | |
dc.source | WOS | |
dc.title | Predictive compact model for stress-induced on-product overlay correction | |
dc.type | Journal article | |
dc.contributor.imecauthor | Blanco, Victor | |
dc.contributor.imecauthor | Canga, Eren | |
dc.contributor.imecauthor | Schleicher, Filip | |
dc.contributor.orcidimec | Canga, Eren::0000-0002-2322-8070 | |
dc.contributor.orcidimec | Schleicher, Filip::0000-0003-3630-7285 | |
dc.contributor.orcidimec | Blanco, Victor::0000-0003-4308-0381 | |
dc.identifier.doi | 10.1117/1.JMM.21.4.043201 | |
dc.source.numberofpages | 17 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 043201 | |
dc.source.endpage | na | |
dc.source.journal | JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 | |
dc.source.issue | 4 | |
dc.source.volume | 21 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The authors acknowledge support from the ASML-IMEC APC program. | |