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Total-dose effects on CMOS active pixel sensors

dc.contributor.authorBogaerts, Jan
dc.contributor.authorDierickx, Bart
dc.date.accessioned2021-10-14T12:41:27Z
dc.date.available2021-10-14T12:41:27Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4133
dc.sourceIIOimport
dc.titleTotal-dose effects on CMOS active pixel sensors
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage157
dc.source.endpage167
dc.source.conferenceSensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
dc.source.conferencedate24/01/2000
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 3965


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