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Radiation effects in CMOS active pixel sensors

dc.contributor.authorBogaerts, Jan
dc.contributor.authorDierickx, Bart
dc.contributor.authorVan Hoof, Chris
dc.date.accessioned2021-10-14T12:41:29Z
dc.date.available2021-10-14T12:41:29Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4134
dc.sourceIIOimport
dc.titleRadiation effects in CMOS active pixel sensors
dc.typeProceedings paper
dc.contributor.imecauthorVan Hoof, Chris
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage67
dc.source.endpage70
dc.source.conferenceRADECS Workshop - Radiation Effects on Components and Systems
dc.source.conferencedate11/09/2000
dc.source.conferencelocationLouvain-la-Neuve Belgium
imec.availabilityPublished - open access


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