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Comparison of assessment methods for in-situ 5G NR base station exposure

dc.contributor.authorDeprez, Kenneth
dc.contributor.authorVerloock, Leen
dc.contributor.authorColussi, Loek
dc.contributor.authorAerts, Sam
dc.contributor.authorVan den Bossche, Matthias 2
dc.contributor.authorKamer, Jos
dc.contributor.authorBolte, John
dc.contributor.authorMartens, Luc
dc.contributor.authorPlets, David
dc.contributor.authorJoseph, Wout
dc.date.accessioned2024-01-22T10:44:04Z
dc.date.available2023-03-24T11:02:11Z
dc.date.available2024-01-22T10:44:04Z
dc.date.issued2022
dc.identifier.issnN/A
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41358.2
dc.titleComparison of assessment methods for in-situ 5G NR base station exposure
dc.typeProceedings paper
dc.contributor.imecauthorDeprez, Kenneth
dc.contributor.imecauthorVerloock, Leen
dc.contributor.imecauthorAerts, Sam
dc.contributor.imecauthorVan den Bossche, Matthias 2
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorPlets, David
dc.contributor.imecauthorJoseph, Wout
dc.contributor.orcidimecDeprez, Kenneth::0000-0002-1954-6738
dc.contributor.orcidimecVerloock, Leen::0000-0001-8392-3481
dc.contributor.orcidimecAerts, Sam::0000-0002-7444-4312
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.contributor.orcidimecPlets, David::0000-0002-8879-5076
dc.contributor.orcidimecJoseph, Wout::0000-0002-8807-0673
dc.date.embargo9999-12-31
dc.source.numberofpages6
dc.source.peerreviewyes
dc.subject.disciplineElectrical & electronic engineering
dc.source.beginpage651
dc.source.endpage656
dc.source.conferenceThe 1st Annual Meeting of BioEM (BioEM 2022)
dc.source.conferencedate19-24 June 2022
dc.source.conferencelocationNagoya, Japan
dc.source.journalConference paper
imec.availabilityPublished - imec


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220.500.12860/41358.2*2024-01-22T10:42:58Zvalidation by library/open access desk
120.500.12860/413582023-03-24T11:02:11Z

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