Authors
Deprez, Kenneth;
Verloock, Leen;
Colussi, Loek;
Aerts, Sam;
Van den Bossche, Matthias 2;
Kamer, Jos;
Bolte, John;
Martens, Luc;
Plets, David;
Joseph, Wout
ISSN
N/A
Conference
The 1st Annual Meeting of BioEM (BioEM 2022)
Journal
Conference paper
Research discipline
Electrical & electronic engineering
Title
Comparison of assessment methods for in-situ 5G NR base station exposure
Publication type
Proceedings paper
Embargo date
9999-12-31