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Radiation-induced dark current increase in CMOS active pixel sensors

dc.contributor.authorBogaerts, Jan
dc.contributor.authorDierickx, Bart
dc.contributor.authorVan Hoof, Chris
dc.date.accessioned2021-10-14T12:41:32Z
dc.date.available2021-10-14T12:41:32Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4135
dc.sourceIIOimport
dc.titleRadiation-induced dark current increase in CMOS active pixel sensors
dc.typeProceedings paper
dc.contributor.imecauthorVan Hoof, Chris
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage105
dc.source.endpage114
dc.source.conferencePhotonics for Space Environments VII
dc.source.conferencedate31/07/2000
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 4134


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