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dc.contributor.authorMatsubayashi, D.
dc.contributor.authorClima, S.
dc.contributor.authorRavsher, T.
dc.contributor.authorGarbin, D.
dc.contributor.authorDelhougne, R.
dc.contributor.authorKar, G. S.
dc.contributor.authorPourtois, G.
dc.date.accessioned2023-05-25T20:20:22Z
dc.date.available2023-05-25T20:20:22Z
dc.date.issued2022
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000968800700102
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41627
dc.sourceWOS
dc.titleOTS Physics-based Screening for Environment-friendly Selector Materials
dc.typeProceedings paper
dc.contributor.imecauthorMatsubayashi, D.
dc.contributor.imecauthorClima, S.
dc.contributor.imecauthorGarbin, D.
dc.contributor.imecauthorDelhougne, R.
dc.contributor.imecauthorKar, G. S.
dc.contributor.imecauthorPourtois, G.
dc.identifier.doi10.1109/IEDM45625.2022.10019445
dc.identifier.eisbn978-1-6654-8959-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
imec.availabilityUnder review


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