dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Matagne, Philippe | |
dc.contributor.author | Vermeersch, Bjorn | |
dc.contributor.author | Jourdain, Anne | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Chen, Rongmei | |
dc.contributor.author | De Keersgieter, An | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Radisic, Dunja | |
dc.contributor.author | Oniki, Yusuke | |
dc.contributor.author | Lafitte, A. | |
dc.contributor.author | Brus, Stephan | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Dentoni Litta, Eugenio | |
dc.contributor.author | Horiguchi, Naoto | |
dc.date.accessioned | 2023-06-01T14:26:07Z | |
dc.date.available | 2023-05-25T20:20:23Z | |
dc.date.available | 2023-06-01T14:26:07Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700177 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41629.2 | |
dc.source | WOS | |
dc.title | Insights into Scaled Logic Devices Connected from Both Wafer Sides | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Matagne, Philippe | |
dc.contributor.imecauthor | Vermeersch, Bjorn | |
dc.contributor.imecauthor | Jourdain, Anne | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Chen, Rongmei | |
dc.contributor.imecauthor | De Keersgieter, An | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Radisic, Dunja | |
dc.contributor.imecauthor | Oniki, Yusuke | |
dc.contributor.imecauthor | Brus, Stephan | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.imecauthor | Dentoni Litta, Eugenio | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Vermeersch, Bjorn::0000-0001-8640-672X | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Oniki, Yusuke::0000-0002-6619-1327 | |
dc.contributor.orcidimec | Brus, Stephan::0000-0003-3554-0640 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.contributor.orcidimec | Dentoni Litta, Eugenio::0000-0003-0333-376X | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019521 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
dc.source.journal | na | |
imec.availability | Published - imec | |