Notice
This item has not yet been validated by imec staff.
Notice
This is not the latest version of this item. The latest version can be found at: https://imec-publications.be/handle/20.500.12860/41629.2
Insights into Scaled Logic Devices Connected from Both Wafer Sides
dc.contributor.author | Veloso, A. | |
dc.contributor.author | Eneman, G. | |
dc.contributor.author | Matagne, P. | |
dc.contributor.author | Vermeersch, B. | |
dc.contributor.author | Jourdain, A. | |
dc.contributor.author | Arimura, H. | |
dc.contributor.author | O'Sullivan, B. | |
dc.contributor.author | Chen, R. | |
dc.contributor.author | De Keersgieter, A. | |
dc.contributor.author | Simoen, E. | |
dc.contributor.author | Radisic, D. | |
dc.contributor.author | Oniki, Y. | |
dc.contributor.author | Laffitte, A. | |
dc.contributor.author | Brus, S. | |
dc.contributor.author | Beyne, E. | |
dc.contributor.author | Litta, E. Dentoni | |
dc.contributor.author | Horiguchi, N. | |
dc.date.accessioned | 2023-05-25T20:20:23Z | |
dc.date.available | 2023-05-25T20:20:23Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700177 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41629 | |
dc.source | WOS | |
dc.title | Insights into Scaled Logic Devices Connected from Both Wafer Sides | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Veloso, A. | |
dc.contributor.imecauthor | Eneman, G. | |
dc.contributor.imecauthor | Matagne, P. | |
dc.contributor.imecauthor | Vermeersch, B. | |
dc.contributor.imecauthor | Jourdain, A. | |
dc.contributor.imecauthor | Arimura, H. | |
dc.contributor.imecauthor | O'Sullivan, B. | |
dc.contributor.imecauthor | Chen, R. | |
dc.contributor.imecauthor | De Keersgieter, A. | |
dc.contributor.imecauthor | Simoen, E. | |
dc.contributor.imecauthor | Radisic, D. | |
dc.contributor.imecauthor | Oniki, Y. | |
dc.contributor.imecauthor | Brus, S. | |
dc.contributor.imecauthor | Beyne, E. | |
dc.contributor.imecauthor | Litta, E. Dentoni | |
dc.contributor.imecauthor | Horiguchi, N. | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019521 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
imec.availability | Under review |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |