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New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
dc.contributor.author | Asanovski, R. | |
dc.contributor.author | Grill, A. | |
dc.contributor.author | Franco, J. | |
dc.contributor.author | Palestri, P. | |
dc.contributor.author | Beckers, A. | |
dc.contributor.author | Kaczer, B. | |
dc.contributor.author | Selmi, L. | |
dc.date.accessioned | 2023-05-25T20:20:42Z | |
dc.date.available | 2023-05-25T20:20:42Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700046 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41637 | |
dc.source | WOS | |
dc.title | New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Grill, A. | |
dc.contributor.imecauthor | Franco, J. | |
dc.contributor.imecauthor | Beckers, A. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019388 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
imec.availability | Under review |
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