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Degradation mapping of IGZO TFTs

dc.contributor.authorRinaudo, P.
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWu, Zhicheng
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2023-06-01T12:32:09Z
dc.date.available2023-05-26T19:52:18Z
dc.date.available2023-06-01T12:32:09Z
dc.date.issued2022
dc.identifier.issn1930-8841
dc.identifier.otherWOS:000972934500022
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41647.2
dc.sourceWOS
dc.titleDegradation mapping of IGZO TFTs
dc.typeProceedings paper
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWu, Zhicheng
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.identifier.doi10.1109/IIRW56459.2022.10032766
dc.identifier.eisbn978-1-6654-5368-4
dc.source.numberofpages5
dc.source.peerreviewyes
dc.source.conferenceIEEE International Integrated Reliability Workshop (IIRW)
dc.source.conferencedateOCT 09-14, 2022
dc.source.conferencelocationSouth Lake Tahoe
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/41647.2*2023-06-01T12:29:40Zvalidation by library/open access desk
120.500.12860/416472023-05-26T19:52:18Z

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