Degradation mapping of IGZO TFTs

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dc.contributor.author	Rinaudo, P.
dc.contributor.author	Chasin, A.
dc.contributor.author	Franco, J.
dc.contributor.author	Wu, Z.
dc.contributor.author	Rassoul, N.
dc.contributor.author	Delhougne, R.
dc.contributor.author	Kaczer, B.
dc.contributor.author	De Wolf, I.
dc.contributor.author	Kar, G. S.
dc.date.accessioned	2023-05-26T19:52:18Z
dc.date.available	2023-05-26T19:52:18Z
dc.date.issued	2022
dc.identifier.issn	1930-8841
dc.identifier.other	WOS:000972934500022
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/41647
dc.source	WOS
dc.title	Degradation mapping of IGZO TFTs
dc.type	Proceedings paper
dc.contributor.imecauthor	Chasin, A.
dc.contributor.imecauthor	Franco, J.
dc.contributor.imecauthor	Wu, Z.
dc.contributor.imecauthor	Rassoul, N.
dc.contributor.imecauthor	Delhougne, R.
dc.contributor.imecauthor	Kaczer, B.
dc.contributor.imecauthor	Kar, G. S.
dc.identifier.doi	10.1109/IIRW56459.2022.10032766
dc.identifier.eisbn	978-1-6654-5368-4
dc.source.numberofpages	5
dc.source.peerreview	yes
dc.source.conference	IEEE International Integrated Reliability Workshop (IIRW)
dc.source.conferencedate	OCT 09-14, 2022
dc.source.conferencelocation	South Lake Tahoe
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/41647.2	2023-06-01T12:29:40Z	validation by library/open access desk
1	20.500.12860/41647*	2023-05-26T19:52:18Z