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Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
dc.contributor.author | Sangani, D. | |
dc.contributor.author | Diaz-Fortuny, J. | |
dc.contributor.author | Bury, E. | |
dc.contributor.author | Kaczer, B. | |
dc.contributor.author | Gielen, G. | |
dc.date.accessioned | 2023-05-26T19:52:18Z | |
dc.date.available | 2023-05-26T19:52:18Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1930-8841 | |
dc.identifier.other | WOS:000972934500015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41648 | |
dc.source | WOS | |
dc.title | Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Sangani, D. | |
dc.contributor.imecauthor | Diaz-Fortuny, J. | |
dc.contributor.imecauthor | Bury, E. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.identifier.doi | 10.1109/IIRW56459.2022.10032756 | |
dc.identifier.eisbn | 978-1-6654-5368-4 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Integrated Reliability Workshop (IIRW) | |
dc.source.conferencedate | OCT 09-14, 2022 | |
dc.source.conferencelocation | South Lake Tahoe | |
imec.availability | Under review |
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