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Accurate measurement and characterization of MCM-D integrated passives up to 50 GHz

dc.contributor.authorCarchon, Geert
dc.contributor.authorBrebels, Steven
dc.contributor.authorVaesen, Kristof
dc.contributor.authorPieters, Philip
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorVandenberghe, S.
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-14T12:42:59Z
dc.date.available2021-10-14T12:42:59Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4169
dc.sourceIIOimport
dc.titleAccurate measurement and characterization of MCM-D integrated passives up to 50 GHz
dc.typeProceedings paper
dc.contributor.imecauthorBrebels, Steven
dc.contributor.imecauthorVaesen, Kristof
dc.contributor.imecauthorPieters, Philip
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecBrebels, Steven::0000-0002-1568-0286
dc.contributor.orcidimecVaesen, Kristof::0000-0001-9971-3593
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage307
dc.source.endpage312
dc.source.conferenceInternational Conference and Exhibition on High Density Interconnect and Systems Packaging - HDI
dc.source.conferencedate26/04/2000
dc.source.conferencelocationDenver, CO USA
imec.availabilityPublished - open access


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