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Accurate measurement and characterization of reciprocal 3-ports, application to CPW T-junctions in thin-film multi-layer MCM-D

dc.contributor.authorCarchon, Geert
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-10-14T12:43:01Z
dc.date.available2021-10-14T12:43:01Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4170
dc.sourceIIOimport
dc.titleAccurate measurement and characterization of reciprocal 3-ports, application to CPW T-junctions in thin-film multi-layer MCM-D
dc.typeProceedings paper
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage453
dc.source.endpage456
dc.source.conferenceAsia-Pacific Microwave Conference
dc.source.conferencedate3/12/2000
dc.source.conferencelocationSydney Australia
imec.availabilityPublished - open access


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